Overview
A new focused ion-beam (FIB) fabrication method has been developed to produce very clean, well-defined and highly reproducible sub-wavelength fiber probes with metallic apertures of a desired diameter for use in near-field scanning optical microscopy (NSOM). The ion beam milling process can eliminate the obstruction of apertures caused by conventional metallic coating techniques, and thus increase the optical output.See U.S. Patent No. 6,633,711
For further information, please contact the Office of Technology Commercialization, (301) 405-3947, E-mail: [email protected].
Contact Info
UM Ventures
0134 Lee Building
7809 Regents Drive
College Park, MD 20742
Email: [email protected]
Phone: (301) 405-3947 | Fax: (301) 314-9502